Invention Grant
- Patent Title: Method and structure for testing and calibrating three axis magnetic field sensing devices
- Patent Title (中): 用于测试和校准三轴磁场感测装置的方法和结构
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Application No.: US13467175Application Date: 2012-05-09
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Publication No.: US09279865B2Publication Date: 2016-03-08
- Inventor: Lianjun Liu , Phillip Mather
- Applicant: Lianjun Liu , Phillip Mather
- Applicant Address: US AZ Chandler
- Assignee: EVERSPIN TECHNOLOGIES, INC.
- Current Assignee: EVERSPIN TECHNOLOGIES, INC.
- Current Assignee Address: US AZ Chandler
- Agency: Bookoff McAndrews, PLLC
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01R33/09 ; G01R33/00 ; G01R33/02

Abstract:
A structure and method are provided for self-test of a Z axis sensor. Two self-test current lines are symmetrically positioned adjacent, but equidistant from, each sense element. The vertical component of the magnetic field created from a current in the self-test lines is additive in a flux guide positioned adjacent, and orthogonal to, the sense element; however, the components of the magnetic fields in the plane of the sense element created by each of the two self-test current line pairs cancel one another at the sense element center, resulting in only the Z axis magnetic field being sensed during the self-test.
Public/Granted literature
- US20130300402A1 METHOD AND STRUCTURE FOR TESTING AND CALIBRATING THREE AXIS MAGNETIC FIELD SENSING DEVICES Public/Granted day:2013-11-14
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