Invention Grant
- Patent Title: Mask blank and photomask
- Patent Title (中): 面膜空白和光掩模
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Application No.: US14054395Application Date: 2013-10-15
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Publication No.: US09280045B2Publication Date: 2016-03-08
- Inventor: Isao Hattori
- Applicant: CLEAN SURFACE TECHNOLOGY CO.
- Applicant Address: JP Kanagawa
- Assignee: CLEAN SURFACE TECHNOLOGY CO.
- Current Assignee: CLEAN SURFACE TECHNOLOGY CO.
- Current Assignee Address: JP Kanagawa
- Agency: Griffin and Szipl PC
- Priority: JP2012-228448 20121015
- Main IPC: G03F1/40
- IPC: G03F1/40 ; G03F1/48

Abstract:
The present invention is to provide a mask blank enabling fabrication of a photomask having a structure where electrostatic breakdown is effectively prevented. To accomplish the object, the invention discloses a mask blank comprising a mask substrate, an electrostatic breakdown prevention film fully covering one side of the mask substrate, and a shading film formed on the electrostatic breakdown prevention film. The electrostatic breakdown prevention film is made of titanium, tantalum, titanium compound or tantalum compound. The transparent rate of the electrostatic breakdown prevention film is not less than 75%, for the wavelength of light in an exposure. The sheet resistance of the electrostatic discharge prevention film is not more than 100KΩ/□.
Public/Granted literature
- US20140106266A1 MASK BLANK AND PHOTOMASK Public/Granted day:2014-04-17
Information query
IPC分类: