Invention Grant
- Patent Title: Method and apparatus for minimizing within-die variations in performance parameters of a processor
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Application No.: US14674200Application Date: 2015-03-31
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Publication No.: US09280162B2Publication Date: 2016-03-08
- Inventor: Luke A. Johnson , Adhiveeraraghavan Srikanth , Wenjun Yun
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Green, Howard & Mughal LLP
- Main IPC: G06F3/00
- IPC: G06F3/00 ; G05F1/10 ; H04L25/02 ; G06F13/12 ; G06F13/10 ; G06F3/06 ; G06F13/14

Abstract:
Described herein are a method and an apparatus for minimizing within-die variations in performance parameters of a processor. The apparatus comprising: a reference generator to generate an adjustable compensated reference signal; a bias generator to generate a bias signal based on the adjustable compensated reference signal; a transmitter coupled with the bias generator to transmit an output signal; and a feedback mechanism to sample the output signal from the transmitter and to provide the sampled output signal to the bias generator.
Public/Granted literature
- US20150248134A1 METHOD AND APPARATUS FOR MINIMIZING WITHIN-DIE VARIATIONS IN PERFORMANCE PARAMETERS OF A PROCESSOR Public/Granted day:2015-09-03
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