Invention Grant
US09280429B2 Power fail latching based on monitoring multiple power supply voltages in a storage device
有权
基于监视存储设备中的多个电源电压的电源故障锁存
- Patent Title: Power fail latching based on monitoring multiple power supply voltages in a storage device
- Patent Title (中): 基于监视存储设备中的多个电源电压的电源故障锁存
-
Application No.: US14135467Application Date: 2013-12-19
-
Publication No.: US09280429B2Publication Date: 2016-03-08
- Inventor: Gregg S. Lucas , Kenneth B. Delpapa , Robert W. Ellis
- Applicant: SanDisk Enterprise IP LLC
- Applicant Address: US CA Milpitas
- Assignee: SANDISK ENTERPRISE IP LLC
- Current Assignee: SANDISK ENTERPRISE IP LLC
- Current Assignee Address: US CA Milpitas
- Agency: Morgan, Lewis & Bockius LLP
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/20 ; G11C29/02 ; G06F11/14 ; G11C29/04

Abstract:
The various embodiments described herein include systems, methods and/or devices used to enable power fail latching based on monitoring multiple power supply voltages in a storage device. In one aspect, the method includes: (1) determining whether a first power supply voltage provided to the storage device is out of range for a first time period, (2) determining whether a second power supply voltage provided to the storage device is out of range for a second time period, and (3) in accordance with a determination that at least one of the first power supply voltage is out of range for the first time period and the second power supply voltage is out of range for the second time period, latching a power fail condition.
Public/Granted literature
- US20150149825A1 Power Fail Latching Based on Monitoring Multiple Power Supply Voltages in a Storage Device Public/Granted day:2015-05-28
Information query