A semiconductor test system includes a nonvolatile memory and a test device. The nonvolatile memory is configured to include an information region. The test device is configured to include a pin memory and a pin memory controller. The pin memory controller is configured to separate information data into a plurality of information data groups, sequentially transmit the separated plurality of information data groups to the pin memory, sequentially transmit the transmitted plurality of information data group in the pin memory to the nonvolatile memory, and program the transmitted plurality of information data group in the nonvolatile memory into the information region.