Invention Grant
- Patent Title: Semiconductor structure
- Patent Title (中): 半导体结构
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Application No.: US13855479Application Date: 2013-04-02
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Publication No.: US09281195B2Publication Date: 2016-03-08
- Inventor: Guan Wei Wu , Yao Wen Chang , I Chen Yang , Tao Cheng Lu
- Applicant: MACRONIX International Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: MACRONIX International Co., Ltd.
- Current Assignee: MACRONIX International Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: J.C. Patents
- Main IPC: H01L29/16
- IPC: H01L29/16 ; H01L21/265 ; G11C16/04 ; H01L21/28 ; H01L29/792 ; H01L27/115 ; H01L29/78 ; H01L29/165 ; G11C11/56 ; G11C16/34

Abstract:
A semiconductor structure has a MOSFET and a substrate to accommodate the MOSFET. The MOSFET has a gate, a source, and a drain in the substrate. A first substrate region surrounding the MOSFET is doped with a stress enhancer, wherein the stress enhancer is configured to generate a tensile stress in the MOSFET's channel and the tensile stress is along the channel's widthwise direction.
Public/Granted literature
- US20140264378A1 SEMICONDUCTOR STRUCTURE Public/Granted day:2014-09-18
Information query
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