Invention Grant
- Patent Title: Ultra-high vacuum (UHV) wafer processing
- Patent Title (中): 超高真空(UHV)晶圆加工
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Application No.: US13679258Application Date: 2012-11-16
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Publication No.: US09281221B2Publication Date: 2016-03-08
- Inventor: Chung-En Kao , Tien-Chen Hu , Mao-Lin Kao , Kuo-Fu Chien , Keith Koai
- Applicant: Taiwan Semiconductor Manufacturing Company Limited
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company Limited
- Current Assignee: Taiwan Semiconductor Manufacturing Company Limited
- Current Assignee Address: TW Hsin-Chu
- Agency: Cooper Legal Group, LLC
- Main IPC: H01L21/67
- IPC: H01L21/67

Abstract:
One or more techniques or systems for ultra-high vacuum (UHV) wafer processing are provided herein. In some embodiments, a vacuum system includes one or more cluster tools connected via one or more bridges. For example, a first cluster tool is connected to a first bridge. Additionally, a second cluster tool is connected to a second bridge. In some embodiments, the first bridge is configured to connect the second cluster tool to the first cluster tool. In some embodiments, the second cluster tool is connected to the first bridge, thus forming a ‘tunnel’. In some embodiments, the second bridge comprises one or more facets configured to enable a connection to an additional process chamber or an additional cluster tool. In this manner, a more efficient UHV environment is provided, thus enhancing a yield associated with wafer processing, for example.
Public/Granted literature
- US20140140792A1 ULTRA-HIGH VACUUM (UHV) WAFER PROCESSING Public/Granted day:2014-05-22
Information query
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