Invention Grant
- Patent Title: Chip scale packages and related methods
- Patent Title (中): 芯片级封装及相关方法
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Application No.: US14528106Application Date: 2014-10-30
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Publication No.: US09281258B1Publication Date: 2016-03-08
- Inventor: Bih Wen Fon , Soon Wei Wang , How Kiat Liew
- Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Applicant Address: US AZ Phoenix
- Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee Address: US AZ Phoenix
- Agency: Adam R. Stephenson, LTD.
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/31 ; H01L23/495 ; H01L25/065 ; H01L23/00 ; H01L21/78 ; H01L21/56 ; H01L25/00

Abstract:
A chip scale package (CSP) includes a die and a first lead mechanically and electrically coupled to a first surface of the die at a first surface of the first lead. The first surface of the first lead forms a first plane. A second lead is mechanically coupled to a second surface of the die at a first surface of the second lead. The first surface of the second lead forms a second plane. A mold compound at least partially encapsulates the die, forming a CSP. The first plane and the second plane are oriented substantially perpendicularly to a third plane formed by a motherboard surface when the CSP is coupled to the motherboard surface. The CSP includes no wirebonds and the first lead and second lead are on opposing surfaces of the CSP. The third plane of the motherboard may be a largest planar surface of the motherboard.
Information query
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