Invention Grant
- Patent Title: Transistor structure and manufacturing method thereof
- Patent Title (中): 晶体管结构及其制造方法
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Application No.: US14452539Application Date: 2014-08-06
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Publication No.: US09281380B2Publication Date: 2016-03-08
- Inventor: Chi-Jen Kao , Yu-Jung Peng , Yi-Kai Wang
- Applicant: Wistron Corporation
- Applicant Address: TW New Taipei
- Assignee: Wistron Corporation
- Current Assignee: Wistron Corporation
- Current Assignee Address: TW New Taipei
- Agency: Jianq Chyun IP Office
- Priority: TW103105304A 20140218
- Main IPC: H01L23/552
- IPC: H01L23/552 ; H01L29/66 ; H01L29/786 ; H01L51/10 ; H01L51/05

Abstract:
A transistor structure including a gate, an insulation layer, a patterned semiconductor layer, a source, a drain and a light absorption layer and a manufacturing method thereof are provided. The gate is disposed on a substrate. An area of the gate overlaps an area of the patterned semiconductor layer. The insulation layer is disposed between the gate and the patterned semiconductor layer. The source and the drain are separated from each other and in contact with the patterned semiconductor layer. The patterned semiconductor layer is disposed between the light absorption layer and the substrate. An area of the light absorption layer overlaps an area of the patterned semiconductor layer. An absorption spectrum of the light absorption layer overlaps an absorption spectrum of the patterned semiconductor layer.
Public/Granted literature
- US20150235967A1 TRANSISTOR STRUCTURE AND MANUFACTURING METHOD THEREOF Public/Granted day:2015-08-20
Information query
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