Invention Grant
US09281486B2 Semiconductor device, method of manufacturing semiconductor device, solid-state imaging unit, and electronic apparatus 有权
半导体装置,半导体装置的制造方法,固态成像装置以及电子装置

  • Patent Title: Semiconductor device, method of manufacturing semiconductor device, solid-state imaging unit, and electronic apparatus
  • Patent Title (中): 半导体装置,半导体装置的制造方法,固态成像装置以及电子装置
  • Application No.: US14366054
    Application Date: 2012-11-20
  • Publication No.: US09281486B2
    Publication Date: 2016-03-08
  • Inventor: Kaori TakimotoTetsuji Yamaguchi
  • Applicant: Sony Corporation
  • Applicant Address: JP Tokyo
  • Assignee: SONY CORPORATION
  • Current Assignee: SONY CORPORATION
  • Current Assignee Address: JP Tokyo
  • Agency: Hazuki International, LLC
  • Priority: JP2011-285353 20111227
  • International Application: PCT/JP2012/080064 WO 20121120
  • International Announcement: WO2013/099475 WO 20130704
  • Main IPC: H01L51/44
  • IPC: H01L51/44 H01L27/30
Semiconductor device, method of manufacturing semiconductor device, solid-state imaging unit, and electronic apparatus
Abstract:
A semiconductor device includes, in order on a substrate, an organic semiconductor layer, an inorganic film, and a protective film. The inorganic film and the protective film each have a peripheral edge portion that is formed in an outer region compared to a peripheral edge portion of the organic semiconductor layer.
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