Invention Grant
- Patent Title: System and method for a diagnostic circuit
- Patent Title (中): 诊断电路的系统和方法
-
Application No.: US14520111Application Date: 2014-10-21
-
Publication No.: US09281746B1Publication Date: 2016-03-08
- Inventor: Mihai-Nicolae Apostolescu , Ansgar Pottbaecker
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater & Matsil, L.L.P.
- Main IPC: G05F1/573
- IPC: G05F1/573 ; H02M3/158

Abstract:
According to an embodiment, a diagnostic circuit is configured to be coupled to an output terminal of a switching circuit and to a sense terminal of a sense circuit coupled in parallel with the switching circuit. The diagnostic circuit includes a configurable feedback circuit configured to be coupled to the output terminal and the sense terminal. The configurable feedback circuit is configured to receive a select signal, switch a configuration of the configurable feedback circuit between a first mode and a second mode based on the select signal, sink a current from the sense circuit in the first mode, source a current to the sense circuit in the second mode, and balance a voltage difference between the output terminal and the sense terminal in the first mode and in the second mode.
Information query
IPC分类: