Invention Grant
- Patent Title: OTDR trace analysis in PON systems
- Patent Title (中): PON系统中的OTDR跟踪分析
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Application No.: US14128740Application Date: 2011-06-30
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Publication No.: US09281892B2Publication Date: 2016-03-08
- Inventor: Patryk Urban
- Applicant: Patryk Urban
- Applicant Address: SE Stockholm
- Assignee: TELEFONAKTIEBOLAGET LM ERICSSON (PUBL)
- Current Assignee: TELEFONAKTIEBOLAGET LM ERICSSON (PUBL)
- Current Assignee Address: SE Stockholm
- Agency: Leffler Intellectual Property Law, PLLC
- International Application: PCT/SE2011/050880 WO 20110630
- International Announcement: WO2013/002692 WO 20130103
- Main IPC: H04B10/08
- IPC: H04B10/08 ; H04B10/071 ; G01M11/00 ; H04B10/077 ; H04B10/27

Abstract:
Fault analysis of a Passive Optical Network comprising Optical Network Terminal(s) uses Optical Time Domain Reflectometry (OTDR). An OTDR measurement signal is supplied to a multistage splitter having a ratio 2:Nroot. At least one drop link which is connected to the multistage splitter comprises one or more sub-splitters which having a ratio 1:Nbranch. A new event location is determined based on the OTDR measurement signal by analyzing OTDR measurement data relating to the sub-splitter based on distance from the multistage splitter and to the sub-splitter. A fault magnitude is calculated for a given location by subtracting an event magnitude obtained from the new OTDR measurement from a reference OTDR measurement and taking into account the number of drop links connected to the last splitter stage and to the sub-splitter in the reference measurement and the new measurement, thereby enabling determination of position and severity of the fault locations.
Public/Granted literature
- US20140126900A1 OTDR TRACE ANALYSIS IN PON SYSTEMS Public/Granted day:2014-05-08
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