Invention Grant
US09282261B2 Method for producing image pickup apparatus and method for producing semiconductor apparatus
有权
用于制造图像拾取装置的方法和用于制造半导体装置的方法
- Patent Title: Method for producing image pickup apparatus and method for producing semiconductor apparatus
- Patent Title (中): 用于制造图像拾取装置的方法和用于制造半导体装置的方法
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Application No.: US14557271Application Date: 2014-12-01
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Publication No.: US09282261B2Publication Date: 2016-03-08
- Inventor: Takatoshi Igarashi , Noriyuki Fujimori , Kazuhiro Yoshida
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Scully, Scott, Murphy & Presser, PC
- Priority: JP2012-123223 20120530
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H04N5/335 ; H01L25/04 ; H01L27/146 ; H04N5/225 ; H01L23/31

Abstract:
A method for producing an image pickup apparatus includes: a process of cutting an image pickup chip substrate where electrode pads are formed around each of the light receiving sections to fabricate image pickup chips; a process of bonding image pickup chips determined as non-defective products to a glass wafer to fabricate a joined wafer; a process of filling a sealing member among the image pickup chips on the joined wafer; a machining process including a thinning a thickness of the joined wafer to flatten a machining surface and a forming through-hole interconnections, each of which is connected to each of the electrode pads; a process of forming a plurality of external connection electrodes, each of which is connected to each of the electrode pads via each of the through-hole interconnections; and a process of cutting the joined wafer.
Public/Granted literature
- US20150085169A1 METHOD FOR PRODUCING IMAGE PICKUP APPARATUS AND METHOD FOR PRODUCING SEMICONDUCTOR APPARATUS Public/Granted day:2015-03-26
Information query
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