Invention Grant
- Patent Title: Estimation of metrics using a plenoptic imaging system
- Patent Title (中): 使用全景成像系统估计度量
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Application No.: US13399484Application Date: 2012-02-17
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Publication No.: US09288389B2Publication Date: 2016-03-15
- Inventor: Sapna A. Shroff , Kathrin Berkner , Lingfei Meng
- Applicant: Sapna A. Shroff , Kathrin Berkner , Lingfei Meng
- Applicant Address: JP Tokyo
- Assignee: Ricoh Co., Ltd.
- Current Assignee: Ricoh Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Fenwick & West LLP
- Main IPC: H04N5/232
- IPC: H04N5/232 ; G06T5/00 ; H04N5/225 ; G02B7/34
Abstract:
The spatial resolution of captured plenoptic images is enhanced. In one aspect, the plenoptic imaging process is modeled by a pupil image function (PIF), and a PIF inversion process is applied to the captured plenoptic image to produce a better resolution estimate of the object.
Public/Granted literature
- US20130215236A1 Estimation of Metrics Using a Plenoptic Imaging System Public/Granted day:2013-08-22
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