Invention Grant
- Patent Title: Chemical characterization of surface features
- Patent Title (中): 表面特征的化学特征
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Application No.: US14032192Application Date: 2013-09-19
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Publication No.: US09297751B2Publication Date: 2016-03-29
- Inventor: Joachim Walter Ahner , Samuel Kah Hean Wong , Maissarath Nassirou , Henry Luis Lott , David M. Tung , Florin Zavaliche , Stephen Keith McLaurin
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/47 ; G01N21/95

Abstract:
Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.
Public/Granted literature
- US20140098368A1 CHEMICAL CHARACTERIZATION OF SURFACE FEATURES Public/Granted day:2014-04-10
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