Invention Grant
- Patent Title: Methods and systems for calibrating LTE antenna systems
- Patent Title (中): 校准LTE天线系统的方法和系统
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Application No.: US14071263Application Date: 2013-11-04
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Publication No.: US09300408B2Publication Date: 2016-03-29
- Inventor: Raja Reddy Katipally , Jari Taskila , Aaron Rose
- Applicant: Radio Frequency Systems, Inc.
- Applicant Address: CN Shanghai
- Assignee: ALCATEL-LUCENT SHANGHAI BELL CO., LTD
- Current Assignee: ALCATEL-LUCENT SHANGHAI BELL CO., LTD
- Current Assignee Address: CN Shanghai
- Agency: Capitol Patent & Trademark Law Firm, PLLC
- Main IPC: H01Q3/26
- IPC: H01Q3/26 ; H01Q25/00 ; H01Q19/17 ; H01Q3/40 ; H04B17/00 ; H04B17/11 ; H04B5/00 ; H04B17/12 ; H04B17/14

Abstract:
Antenna array calibration systems and related methods include or utilize a plurality of signal splitter/combiner networks. Each of the signal splitter/combiner networks has a calibration signal sampling point in electrical communication with a signal input point, and signal output points. Each calibration signal sampling point may be capacitively coupled to a respective calibration source input of a calibration network. The signal splitter/combiner networks may be formed as phase-shifting networks.
Public/Granted literature
- US20150126135A1 Methods And Systems For Calibrating LTE Antenna Systems Public/Granted day:2015-05-07
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