Invention Grant
- Patent Title: Method and apparatus for monitoring a polishing surface of a polishing pad used in polishing apparatus
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Application No.: US14800896Application Date: 2015-07-16
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Publication No.: US09302366B2Publication Date: 2016-04-05
- Inventor: Hiroyuki Shinozaki , Takahiro Shimano , Akira Imamura , Akira Nakamura
- Applicant: EBARA CORPORATION
- Applicant Address: JP Tokyo
- Assignee: EBARA CORPORATION
- Current Assignee: EBARA CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2011-124057 20110602
- Main IPC: B24B49/02
- IPC: B24B49/02 ; B24B49/18 ; B24B37/04 ; B24B53/08 ; B24B37/005 ; B24B53/017

Abstract:
A method is capable of monitoring the polishing surface of the polishing pad without removing the polishing pad from the polishing table. The method includes: conditioning the polishing surface of the polishing pad by causing a rotating dresser to oscillate on the polishing surface; measuring a height of the polishing surface when the conditioning of the polishing surface is performed; calculating a position of a measuring point of the height on a two-dimensional surface defined on the polishing surface; and repeating the measuring of the height of the polishing surface and the calculating of the position of the measuring point to create height distribution in the polishing surface.
Public/Granted literature
- US20150314416A1 METHOD AND APPARATUS FOR MONITORING A POLISHING SURFACE OF A POLISHING PAD USED IN POLISHING APPARATUS Public/Granted day:2015-11-05
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