Invention Grant
- Patent Title: Method and system for aligning a point of aim with a point of impact for a projectile device
- Patent Title (中): 将瞄准点与射弹装置的冲击点对准的方法和系统
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Application No.: US13865643Application Date: 2013-04-18
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Publication No.: US09303951B2Publication Date: 2016-04-05
- Inventor: Jack Hancosky
- Applicant: Umarex USA, Inc.
- Applicant Address: US AR Forth Smith
- Assignee: Umarex USA, Inc.
- Current Assignee: Umarex USA, Inc.
- Current Assignee Address: US AR Forth Smith
- Agency: Winthrop & Weinstine, P.A.
- Main IPC: F41G1/00
- IPC: F41G1/00 ; F41G1/35 ; F41G11/00

Abstract:
A method of aligning a point of aim with a point of impact for a projectile device is disclosed. Using a superposition device coupled to the projectile device, at least three reference points are superposed within a first target area with at least three diverging beams of the superposition device. Positions for at least three of the reference points are noted. A projectile is shot from the projectile device at a second target area, while the positions of the at least three reference points are maintained, to create the point of impact. The point of aim for the projectile device is adjusted to correspond with the point of impact while the positions of the at least three reference points are maintained. A system for aligning a point of aim with a point of impact for a projectile device is also disclosed.
Public/Granted literature
- US20160047624A1 METHOD AND SYSTEM FOR ALIGNING A POINT OF AIM WITH A POINT OF IMPACT FOR A PROJECTILE DEVICE Public/Granted day:2016-02-18
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