Invention Grant
- Patent Title: Position-measuring device
- Patent Title (中): 位置测量装置
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Application No.: US14549605Application Date: 2014-11-21
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Publication No.: US09303981B2Publication Date: 2016-04-05
- Inventor: Juergen Schoser , Wolfgang Holzapfel , Michael Hermann , Volker Hoefer
- Applicant: DR. JOHANNES HEIDENHAIN GmbH
- Applicant Address: DE Traunreut
- Assignee: DR. JOHANNES HEIDENHAIN GMBH
- Current Assignee: DR. JOHANNES HEIDENHAIN GMBH
- Current Assignee Address: DE Traunreut
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: DE102013224405 20131128; DE102014215633 20140807
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G01D5/347 ; G01D5/38

Abstract:
A position-measuring device includes a scale and a scanning unit movable relative thereto. The scale has a measuring graduation, a reference mark and area markings located on a first and on a second side of the reference mark which are configured to exert different deflection effects on a scanning beam incident thereon. An area signal detector is configured to detect, during optical scanning of the area markings, a fringe pattern in a detection plane of the area signal detector. A periodic screen grating is disposed between the scale and the area signal detector and is configured to produce the fringe pattern in the detection plane of the area signal detector such that at least two distinguishable scanning signals are generatable from the fringe pattern as a function of a position of the scanning unit relative to the reference mark.
Public/Granted literature
- US20150146217A1 POSITION-MEASURING DEVICE Public/Granted day:2015-05-28
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