Invention Grant
US09304082B2 Information acquiring apparatus and information acquiring method for acquiring information on specimen by using terahertz wave 有权
信息获取装置和信息获取方法,用于通过使用太赫兹波来获取关于标本的信息

Information acquiring apparatus and information acquiring method for acquiring information on specimen by using terahertz wave
Abstract:
An information acquiring apparatus that acquires information on a specimen by applying terahertz wave to the specimen through a plate-like member, the specimen being provided between a reflecting member having a reflecting surface and the plate-like member. The apparatus includes an applying unit that applies the terahertz wave to the specimen, a detecting unit that detects the terahertz wave reflected from the specimen, and an information acquiring unit that acquires the information on the specimen by using temporal waveforms acquired from a result of detection performed by the detecting unit, the information acquiring unit using at least a temporal waveform representing a portion of the terahertz wave that is reflected by an interface between the plate-like member and the specimen and a temporal waveform representing a portion of the terahertz wave that is reflected by an interface between the specimen and the reflecting surface of the reflecting member.
Information query
Patent Agency Ranking
0/0