Invention Grant
US09304082B2 Information acquiring apparatus and information acquiring method for acquiring information on specimen by using terahertz wave
有权
信息获取装置和信息获取方法,用于通过使用太赫兹波来获取关于标本的信息
- Patent Title: Information acquiring apparatus and information acquiring method for acquiring information on specimen by using terahertz wave
- Patent Title (中): 信息获取装置和信息获取方法,用于通过使用太赫兹波来获取关于标本的信息
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Application No.: US14485453Application Date: 2014-09-12
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Publication No.: US09304082B2Publication Date: 2016-04-05
- Inventor: Takayuki Koizumi
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA, Inc. I.P. Division
- Priority: JP2013-191797 20130917; JP2014-166865 20140819
- Main IPC: G01J5/02
- IPC: G01J5/02 ; G01N21/55 ; G01N33/48 ; G01N21/3586 ; G01N21/3563 ; G01N21/3581

Abstract:
An information acquiring apparatus that acquires information on a specimen by applying terahertz wave to the specimen through a plate-like member, the specimen being provided between a reflecting member having a reflecting surface and the plate-like member. The apparatus includes an applying unit that applies the terahertz wave to the specimen, a detecting unit that detects the terahertz wave reflected from the specimen, and an information acquiring unit that acquires the information on the specimen by using temporal waveforms acquired from a result of detection performed by the detecting unit, the information acquiring unit using at least a temporal waveform representing a portion of the terahertz wave that is reflected by an interface between the plate-like member and the specimen and a temporal waveform representing a portion of the terahertz wave that is reflected by an interface between the specimen and the reflecting surface of the reflecting member.
Public/Granted literature
Information query