Invention Grant
- Patent Title: Device and method for measuring dynamic thermal conductivity of micro-structure fluid
- Patent Title (中): 用于测量微结构流体动态热导率的装置和方法
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Application No.: US13814079Application Date: 2011-08-12
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Publication No.: US09304093B2Publication Date: 2016-04-05
- Inventor: Wook-Hyun Lee , Seong-Ryong Park , Chong-Youp Kim , Seok-Won Kim
- Applicant: Wook-Hyun Lee , Seong-Ryong Park , Chong-Youp Kim , Seok-Won Kim
- Applicant Address: KR Daejeon
- Assignee: KOREA INSTITUTE OF ENERGY RESEARCH
- Current Assignee: KOREA INSTITUTE OF ENERGY RESEARCH
- Current Assignee Address: KR Daejeon
- Agency: Westman, Champlin & Koehler, P.A.
- Agent Amanda M. Prose
- Priority: KR10-2010-0078003 20100812
- International Application: PCT/KR2011/005926 WO 20110812
- International Announcement: WO2012/021021 WO 20120216
- Main IPC: G01N25/18
- IPC: G01N25/18

Abstract:
A device and method for measuring dynamic thermal conductivity of micro-structure fluid. The device includes an upper fixing plate (110a) and a lower fixing plate (110b) which are vertically spaced apart from each other, a lower body (150b) which defines a side surface of a separation space formed between the upper fixing plate and the lower fixing plate, a rotating plate (120) which is disposed in the separation space in such a way that gaps are respectively formed among the rotating plate and the upper and lower fixing plates, a shaft (140) which passes through the upper fixing plate and is coupled to the rotating plate, a heater which installed on an upper portion of the upper fixing plate, and thermocouples (118a) and (118b) which are respectively installed in the upper and lower fixing plates.
Public/Granted literature
- US20130128916A1 Device and Method for Measuring Dynamic Thermal Conductivity of Micro-Structure Fluid Public/Granted day:2013-05-23
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