Invention Grant
- Patent Title: Method of measuring a capacitance
- Patent Title (中): 测量电容的方法
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Application No.: US13882641Application Date: 2011-10-31
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Publication No.: US09304096B2Publication Date: 2016-04-05
- Inventor: Dag Erlandsson , Martin Hedstrom , Bo Mattiasson , Joakim Larsson
- Applicant: Dag Erlandsson , Martin Hedstrom , Bo Mattiasson , Joakim Larsson
- Applicant Address: SE Billeberga
- Assignee: CAPSENZE HB
- Current Assignee: CAPSENZE HB
- Current Assignee Address: SE Billeberga
- Agency: Brooks Kushman P.C.
- Priority: SE1051143 20101101
- International Application: PCT/SE2011/000192 WO 20111031
- International Announcement: WO2012/060758 WO 20120510
- Main IPC: G01R29/26
- IPC: G01R29/26 ; G01N27/22 ; G01N27/327 ; G01R27/26

Abstract:
A method of measuring a capacitance (C) of a sensor having a working electrode that is coated by an insulating layer and a ligand forming an affinity surface. The method involves the steps of bringing the electrode into contact with an analyte, supplying a constant first current (I1), and a constant second current (I2) of opposite direction to the first current (I1), and a constant third current (I3) of same direction as the first current (I1) during determined time periods to the sensor. Further the method includes sampling the potential (V) built up across the sensor, and calculating the capacitance of the sensor from the inclination (B, D, F, H) of a potential curve received in response to the current supply. A method used for detection of an interaction between a ligand and an analyte is also disclosed.
Public/Granted literature
- US20130304397A1 METHOD OF MEASURING A CAPACITANCE Public/Granted day:2013-11-14
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