Invention Grant
- Patent Title: Quenching depth measurement method and quenching depth measurement apparatus
- Patent Title (中): 淬火深度测量方法和淬火深度测量仪
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Application No.: US13881444Application Date: 2011-10-26
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Publication No.: US09304108B2Publication Date: 2016-04-05
- Inventor: Yuji Gotoh , Noriyoshi Takaoka , Kazuhiro Kawasaki , Yoshitaka Misaka
- Applicant: Yuji Gotoh , Noriyoshi Takaoka , Kazuhiro Kawasaki , Yoshitaka Misaka
- Applicant Address: JP Tokyo JP Oita
- Assignee: NETUREN CO., LTD.,NATIONAL UNIVERSITY CORPORATION OITA UNIVERSITY
- Current Assignee: NETUREN CO., LTD.,NATIONAL UNIVERSITY CORPORATION OITA UNIVERSITY
- Current Assignee Address: JP Tokyo JP Oita
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2010-239894 20101026
- International Application: PCT/JP2011/074709 WO 20111026
- International Announcement: WO2012/057224 WO 20120503
- Main IPC: G01N27/80
- IPC: G01N27/80 ; G01N27/72

Abstract:
A quenching depth measuring method is used for measuring the quenching depth in a workpiece and includes the steps of: magnetizing the workpiece by disposing, in the vicinity of the workpiece, a magnetizer equipped with an exciting coil; detecting, through a detection coil, an induced magnetic field generated by the magnetization; measuring the induced magnetic field as the output voltage of the detection coil; and specifying the thickness of the quenched hardened layer of the workpiece on the basis of known electromagnetic characteristic information of an unquenched material and a fully-quenched material and an output voltage value measured by the detection coil, the unquenched material being made of the same material as the constituent material of the workpiece and being a material on which a quenching process is not performed, the fully-quenched material being a material on which the quenching process is performed.
Public/Granted literature
- US20130300405A1 QUENCHING DEPTH MEASUREMENT METHOD AND QUENCHING DEPTH MEASUREMENT APPARATUS Public/Granted day:2013-11-14
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