Invention Grant
- Patent Title: Sample analyzer
- Patent Title (中): 样品分析仪
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Application No.: US13251501Application Date: 2011-10-03
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Publication No.: US09304140B2Publication Date: 2016-04-05
- Inventor: Yuji Wakamiya
- Applicant: Yuji Wakamiya
- Applicant Address: JP Kobe
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe
- Agency: Brinks Gilson & Lione
- Priority: JP2010-229947 20101012
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N35/00

Abstract:
A sample analyzer comprising: a sample dispenser for dispensing a sample into a reaction container; a sample transporter for sequentially transports a plurality of reaction containers along a transporting path; a processing station including a plurality of processing sections and a transferring section that transfers a reaction container between the sample transporter and the processing sections; and a controller is disclosed. The sample dispenser sequentially dispenses samples at intervals. The controller alternates the interval when problem occurred at any of the processing sections.
Public/Granted literature
- US20120087830A1 SAMPLE ANALYZER Public/Granted day:2012-04-12
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