Invention Grant
- Patent Title: Radio-frequency reflectometry scanning tunneling microscope
- Patent Title (中): 射频反射扫描隧道显微镜
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Application No.: US14490812Application Date: 2014-09-19
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Publication No.: US09304146B2Publication Date: 2016-04-05
- Inventor: Woei-Wu Pai , Huan-Hsin Li , I-Jan Chen , Yen-Cheng Chao
- Applicant: National Taiwan University
- Applicant Address: TW Taipei
- Assignee: NATIONAL TAIWAN UNIVERSITY
- Current Assignee: NATIONAL TAIWAN UNIVERSITY
- Current Assignee Address: TW Taipei
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: TW102125746A 20130718; TW103124553A 20140717
- Main IPC: G01Q60/16
- IPC: G01Q60/16

Abstract:
An RF reflectometry scanning tunneling microscope is suitable for observing a surface of an object, and includes a probe that cooperates with the object to form a tunneling resistor therebetween, an RF resonant circuit that cooperates with the tunneling resistor to form a LCR resonant circuit including an inductor connected to a parallel connection of a capacitor, a resistor and the tunneling resistor, a directional coupler receiving an RF signal and outputting the RF signal to the LCR resonant circuit, and an RF signal measuring device that generates a scanning result associated with the surface of the object based on a reflected RF signal resulting from reflection of the RF signal by the LCR resonant circuit.
Public/Granted literature
- US20150026847A1 RADIO-FREQUENCY REFLECTOMETRY SCANNING TUNNELING MICROSCOPE Public/Granted day:2015-01-22
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