Invention Grant
- Patent Title: Light scanning microscope and microscopy method
- Patent Title (中): 光扫描显微镜和显微镜法
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Application No.: US13902763Application Date: 2013-05-24
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Publication No.: US09304307B2Publication Date: 2016-04-05
- Inventor: Wibke Hellmich , Gerhard Krampert , Matthias Langhorst , Ralf Netz
- Applicant: Wibke Hellmich , Gerhard Krampert , Matthias Langhorst , Ralf Netz
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee Address: DE Jena
- Agency: Skaar Ulbrich Macari, P.A.
- Priority: DE102012208869 20120325
- Main IPC: G02B26/02
- IPC: G02B26/02 ; G02B21/00

Abstract:
A light scanning microscope with an illumination module generates several illumination beams and moves them, in each case as a spot, in a predefined region of a sample to excite sample radiation. A detector module for confocal detection of the sample radiation excited by each spot includes a first detector, an imaging lens system, having an optical axis, for imaging the predefined region along an imaging beam path running from the sample as far as the first detector, and a rotatable diaphragm with several pinholes located in a pinhole plane. The diaphragm, upon rotation, may be located at least partially in the imaging beam path for confocal detection. A second detector may be arranged outside of the imaging beam path. A first beam splitter may be arranged in the imaging beam path between the sample and the diaphragm. The beam splitter deflects sample radiation onto the second detector.
Public/Granted literature
- US20130314758A1 LIGHT SCANNING MICROSCOPE AND MICROSCOPY METHOD Public/Granted day:2013-11-28
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