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US09305931B2 Zero cost NVM cell using high voltage devices in analog process 有权
零成本NVM单元在模拟过程中使用高压器件

Zero cost NVM cell using high voltage devices in analog process
Abstract:
A non-volatile memory cell and array structure is disclosed situated within a high voltage region of an integrated circuit. The cell utilizes capacitive coupling based on an overlap between a gate and a drift region to impart a programming voltage. Programming is effectuated using a drain extension which can act to inject hot electrons. The cell can be operated as a one-time programmable (OTP) or multiple-time programmable (MTP) device. The fabrication of the cell relies on processing steps associated with high voltage devices, thus avoiding the need for additional masks, manufacturing steps, etc.
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