Invention Grant
- Patent Title: Self-capacitance detection using trans-conductance reference
- Patent Title (中): 使用反电导参考的自电容检测
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Application No.: US13471094Application Date: 2012-05-14
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Publication No.: US09306560B2Publication Date: 2016-04-05
- Inventor: Tajeshwar Singh
- Applicant: Tajeshwar Singh
- Applicant Address: US CA San Jose
- Assignee: Atmel Corporation
- Current Assignee: Atmel Corporation
- Current Assignee Address: US CA San Jose
- Agency: Baker Botts L.L.P.
- Main IPC: G01R27/26
- IPC: G01R27/26 ; H03K17/955 ; G06F3/044

Abstract:
In one embodiment, a method includes modifying a voltage at a capacitance of a touch sensor to a first voltage level. The method also includes modifying the voltage at the capacitance to a second voltage level, resulting in a first current. The method also includes modifying a voltage at an integration capacitor to a charging-voltage level based on the first current. The method also includes determining whether a touch input to the touch sensor has occurred based on the charging-voltage level.
Public/Granted literature
- US20130300438A1 Self-Capacitance Detection Using Trans-Conductance Reference Public/Granted day:2013-11-14
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