Invention Grant
- Patent Title: Line pair based full field sharpness test
- Patent Title (中): 基于线对的全场锐度测试
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Application No.: US13630359Application Date: 2012-09-28
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Publication No.: US09307230B2Publication Date: 2016-04-05
- Inventor: Fei Wu , Mark N. Gamadia , Shizhe Shen
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: G06K9/00
- IPC: G06K9/00 ; H04N17/00

Abstract:
Optical characteristics of an optical component for a high volume manufacture consumer electronics device can be tested using a test chart composed of a superposition of two or more groups of parallel line pairs, wherein all the groups of parallel line pairs are oriented at a different inclination. The groups of line pairs could be oriented so that they are perpendicular to each other. A test system can quickly and objectively assess for example the sharpness of the optical component in different directions across a full image field of view of an imaging system that is capturing a digital image of the chart using the optical component for through-the-lens imaging. Other embodiments are also described and claimed.
Public/Granted literature
- US20140002673A1 LINE PAIR BASED FULL FIELD SHARPNESS TEST Public/Granted day:2014-01-02
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