Invention Grant
- Patent Title: Method and apparatus for polishing a substrate
- Patent Title (中): 抛光基板的方法和装置
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Application No.: US13057605Application Date: 2009-08-07
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Publication No.: US09308621B2Publication Date: 2016-04-12
- Inventor: Makoto Fukushima , Tetsuji Togawa , Shingo Saito , Tomoshi Inoue
- Applicant: Makoto Fukushima , Tetsuji Togawa , Shingo Saito , Tomoshi Inoue
- Applicant Address: JP Tokyo
- Assignee: EBARA CORPORATION
- Current Assignee: EBARA CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2008-213064 20080821
- International Application: PCT/JP2009/064319 WO 20090807
- International Announcement: WO2010/021297 WO 20100225
- Main IPC: B24B49/10
- IPC: B24B49/10 ; B24B49/16 ; B24B37/005 ; B24B37/32 ; B24B37/04 ; B24B49/12

Abstract:
A polishing method is used for polishing a substrate such as a semiconductor wafer to a flat mirror finish. A method of polishing a substrate by a polishing apparatus includes a polishing table (100) having a polishing surface, a top ring (1) for holding a substrate and pressing the substrate against the polishing surface, and a vertically movable mechanism (24) for moving the top ring (1) in a vertical direction. The top ring (1) is moved to a first height before the substrate is pressed against the polishing surface, and then the top ring (1) is moved to a second height after the substrate is pressed against the polishing surface.
Public/Granted literature
- US20110159783A1 METHOD AND APPARATUS FOR POLISHING A SUBSTRATE Public/Granted day:2011-06-30
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