Invention Grant
- Patent Title: Impact testing device
- Patent Title (中): 冲击试验装置
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Application No.: US14146340Application Date: 2014-01-02
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Publication No.: US09310282B2Publication Date: 2016-04-12
- Inventor: Kun-Ta Lee
- Applicant: Kun-Ta Lee
- Agency: Cantor Colburn LLP
- Priority: TW102130436A 20130826
- Main IPC: G01N3/02
- IPC: G01N3/02 ; G01N3/30

Abstract:
An impacting testing device is provided. The impacting testing device comprises a first platform, a second platform, a plurality of first suspension devices, at least one impact assembly and a plurality of second suspension devices. The at least one impact assembly is disposed on the second platform and faces the first platform for providing at least one impact force to the first platform, and thus, the impact testing is executed on an object disposed on the first platform.
Public/Granted literature
- US20150052971A1 IMPACT TESTING DEVICE Public/Granted day:2015-02-26
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