Invention Grant
- Patent Title: Power device analyzer
- Patent Title (中): 电源设备分析仪
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Application No.: US13869221Application Date: 2013-04-24
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Publication No.: US09310408B2Publication Date: 2016-04-12
- Inventor: Atsushi Mikata , Hisao Kakitani , Koji Tokuno , Shinichi Tanida , Yoshimi Nagai
- Applicant: Keysight Technologies, Inc.
- Applicant Address: US CA Santa Rosa
- Assignee: Keysight Technologies, Inc.
- Current Assignee: Keysight Technologies, Inc.
- Current Assignee Address: US CA Santa Rosa
- Main IPC: G01R25/00
- IPC: G01R25/00 ; G01R29/26 ; G01R31/26

Abstract:
A device analyzer for analyzing power devices. An example device analyzer comprises a collector supply to generate supply signal pulses with selected voltage or current levels and a supply signal pulse width at a high current. The supply signal pulses are applied at a collector supply source terminal when DUT is connected to conduct current between the collector supply source terminal and a collector supply common terminal. A supply switch closes or opens the DUT current path in narrow pulses having a narrow pulse width narrower than the supply signal pulses to conduct the supply signal pulses as narrowed sweep signal pulses having the high current capacity of the collector supply current. The supply switch alternatively regulates the current in the current path at constant current levels. Other modules capable of high power test capabilities may also be added.
Public/Granted literature
- US20130320959A1 Power Device Analyzer Public/Granted day:2013-12-05
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