Invention Grant
US09310419B2 Method for detecting defective electrodes in a micro-electrode matrix
有权
用于检测微电极矩阵中的有缺陷的电极的方法
- Patent Title: Method for detecting defective electrodes in a micro-electrode matrix
- Patent Title (中): 用于检测微电极矩阵中的有缺陷的电极的方法
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Application No.: US13847799Application Date: 2013-03-20
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Publication No.: US09310419B2Publication Date: 2016-04-12
- Inventor: Alexandre Chibane , Pierre Grangeat
- Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE
- Applicant Address: FR Paris
- Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE
- Current Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE
- Current Assignee Address: FR Paris
- Agency: Oliff PLC
- Priority: FR0704446 20070621
- Main IPC: G01N27/416
- IPC: G01N27/416 ; G01R31/12

Abstract:
The method for detecting defective electrodes in an electrode matrix comprises measurement of an electrochemical impedance spectrum for each of the electrodes. Modeling of the spectrum impedance relative to each electrode by means of an implicit non-integral frequency model is performed in the form of a parameter matrix. Principal components analysis of the matrix is performed to transform said parameter matrix into a final matrix containing decorrelated variables representing the parameter matrix in a new space. The distance between each electrode and a reference point is calculated. These calculated distances are compared with a preset threshold distance and the electrodes having a distance greater than the threshold distance are classified as being defective.
Public/Granted literature
- US20130297236A1 Method for Detecting Defective Electrodes in a Micro-Electrode Matrix Public/Granted day:2013-11-07
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