Invention Grant
- Patent Title: Magnetic field measuring apparatus and method for manufacturing same
- Patent Title (中): 磁场测量装置及其制造方法
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Application No.: US14358810Application Date: 2011-11-18
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Publication No.: US09310447B2Publication Date: 2016-04-12
- Inventor: Yudai Kamada , Taro Osabe , Seiichi Suzuki , Akihiko Kandori , Ryuzo Kawabata
- Applicant: Yudai Kamada , Taro Osabe , Seiichi Suzuki , Akihiko Kandori , Ryuzo Kawabata
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, P.C.
- International Application: PCT/JP2011/006417 WO 20111118
- International Announcement: WO2013/072967 WO 20130523
- Main IPC: G01R3/00
- IPC: G01R3/00 ; G01R33/032 ; G01R33/26

Abstract:
In order to provide a magnetic field measuring apparatus facilitating the pressure control in a gas cell, or capable of inspecting the internal pressure of the gas cell without using any special process, the magnetic field measuring apparatus is configured such that a process layer of the magnetic field measuring apparatus has such a structure that includes a first hollow portion and a second hollow portion provided opposed to first hollow portion with a first isolation wall interposed therebetween. Alternatively, a method for manufacturing the magnetic field measuring apparatus includes breaking the first isolation wall after generating alkali metal (FIG. 17 and FIG. 20).
Public/Granted literature
- US20140306700A1 MAGNETIC FIELD MEASURING APPARATUS AND METHOD FOR MANUFACTURING SAME Public/Granted day:2014-10-16
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