Invention Grant
- Patent Title: Sensor and method for fabricating the same
- Patent Title (中): 传感器及其制造方法
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Application No.: US14128263Application Date: 2012-11-23
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Publication No.: US09312290B2Publication Date: 2016-04-12
- Inventor: Shaoying Xu , Zhenyu Xie , Xu Chen
- Applicant: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Applicant Address: CN Beijing
- Assignee: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: Ladas & Parry LLP
- Priority: CN201210262839 20120726
- International Application: PCT/CN2012/085186 WO 20121123
- International Announcement: WO2014/015592 WO 20140130
- Main IPC: H01L31/0352
- IPC: H01L31/0352 ; H01L21/00 ; H01L27/146 ; H01L29/04 ; G02F1/1343 ; G01T1/24 ; H01L31/0224

Abstract:
A sensor and its fabrication method are provided, wherein the sensor includes: a base substrate, a group of gate lines and a group of data lines arranged as crossing each other, and a plurality of sensing elements arranged in an array and defined by the group of gate lines and the group of data lines, each sensing element comprising a TFT device and a photodiode sensing device, wherein the TFT device is a top gate TFT. The photodiode sensing device includes: a receiving electrode connected with a source electrode, a photodiode disposed on the receiving electrode, a transparent electrode disposed on the photodiode, and a bias line disposed on and connected with the transparent electrode, the bias line is disposed as parallel to the gate line. In comparison with the conventional technology, the method for fabricating the sensor of the invention reduces the number of mask as well as the production cost and simplifies the production process, thereby significantly improves the production capacity and the defect free rate.
Public/Granted literature
- US20150221688A1 SENSOR AND METHOD FOR FABRICATING THE SAME Public/Granted day:2015-08-06
Information query
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