Invention Grant
- Patent Title: Strain relaxation using metal materials and related structures
- Patent Title (中): 应变松弛使用金属材料和相关结构
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Application No.: US14165471Application Date: 2014-01-27
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Publication No.: US09312339B2Publication Date: 2016-04-12
- Inventor: Christiaan J. Werkhoven
- Applicant: Soitec
- Applicant Address: FR Bernin
- Assignee: Soitec
- Current Assignee: Soitec
- Current Assignee Address: FR Bernin
- Agency: TraskBritt
- Main IPC: H01L29/20
- IPC: H01L29/20 ; H01L21/18 ; H01L21/762 ; H01L21/24 ; H01L21/02 ; H01L29/06

Abstract:
Methods of fabricating semiconductor structures include forming a plurality of openings extending through a semiconductor material and at least partially through a metal material and deforming the metal material to relax a remaining portion of the semiconductor material. The metal material may be deformed by exposing the metal material to a temperature sufficient to alter (i.e., increase) its ductility. The metal material may be formed from one or more of hafnium, zirconium, yttrium, and a metallic glass. Another semiconductor material may be deposited over the remaining portions of the semiconductor material, and a portion of the metal material may be removed from between each of the remaining portions of the semiconductor material. Semiconductor structures may be formed using such methods.
Public/Granted literature
- US20140138796A1 STRAIN RELAXATION USING METAL MATERIALS AND RELATED STRUCTURES Public/Granted day:2014-05-22
Information query
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