Invention Grant
- Patent Title: Slew based process and bias monitors and related methods
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Application No.: US14755689Application Date: 2015-06-30
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Publication No.: US09319034B2Publication Date: 2016-04-19
- Inventor: David A. Kidd , Edward J. Boling , Vineet Agrawal , Samuel Leshner , Augustine Kuo , Sang-Soo Lee , Chao-Wu Chen
- Applicant: Mie Fujitsu Semiconductor Limited
- Applicant Address: JP Kuwana, Mie
- Assignee: Mie Fujitsu Semiconductor Limited
- Current Assignee: Mie Fujitsu Semiconductor Limited
- Current Assignee Address: JP Kuwana, Mie
- Agency: Baker Botts L.L.P.
- Main IPC: H03K3/01
- IPC: H03K3/01 ; G05F1/10 ; G05F3/02 ; H03K5/05 ; H01L21/66 ; H03K5/04 ; H03K3/017

Abstract:
An integrated circuit can include at least one slew generator circuit comprising at least one body biasable reference transistor, the slew generator circuit configured to generate at least a first signal having a slew rate that varies according to characteristics of the reference transistor; a pulse generator circuit configured to generate a pulse signal having a first pulse with a duration corresponding to the slew rate of the first signal; and a counter configured to generate a count value corresponding to a duration of the first pulse.
Public/Granted literature
- US20150303905A1 Slew Based Process and Bias Monitors and Related Methods Public/Granted day:2015-10-22
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