Invention Grant
- Patent Title: Slit lamp microscope
-
Application No.: US14122877Application Date: 2012-05-16
-
Publication No.: US09320429B2Publication Date: 2016-04-26
- Inventor: Takumi Uchiyama
- Applicant: Takumi Uchiyama
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOPCON
- Current Assignee: KABUSHIKI KAISHA TOPCON
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP2011-132372 20110614
- International Application: PCT/JP2012/062464 WO 20120516
- International Announcement: WO2012/172907 WO 20121220
- Main IPC: A61B3/10
- IPC: A61B3/10 ; A61B3/135

Abstract:
A slit lamp microscope capable of appropriately and easily carrying out the setting of the optical system is provided. In storage 102 of a slit lamp microscope 1, correspondence information 110 is stored in which standard setting conditions of an illumination system 8 and/or an observation system 6 are associated with each of multiple sites of an eye E. A searching part 121 searches the standard setting conditions corresponding to a site designated by an operation part 104 from the correspondence information 110. A setting-state acquiring part 122 acquires current setting states of the illumination system 8 and/or the observation system 6. A setting-state specifying part specifies, from among the current setting states acquired by the setting-state acquiring part 122, those differing from the standard setting conditions searched by the searching part 121. A controller displays information based on this specified result on the display 103.
Public/Granted literature
- US09364146B2 Slit lamp microscope Public/Granted day:2016-06-14
Information query