Invention Grant
- Patent Title: Systems and methods for implant distance measurement
- Patent Title (中): 植入物距离测量的系统和方法
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Application No.: US11559727Application Date: 2006-11-14
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Publication No.: US09320569B2Publication Date: 2016-04-26
- Inventor: Charles Frederick Lloyd , Jon Thomas Lea
- Applicant: Charles Frederick Lloyd , Jon Thomas Lea
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Agency: McAndrews, Held & Malloy, Ltd.
- Agent William Baxter
- Main IPC: A61B19/00
- IPC: A61B19/00 ; A61B17/70

Abstract:
Certain embodiments of the present invention provide systems and methods for implant distance measurement. Certain embodiments of a method provide determining a tool trajectory, comparing the trajectory to one or more measured distances stored in memory to identify a requested distance measurement, and indicating the requested distance measurement to a user based on a matched trajectory. Certain embodiments of a system provide a processor configured to determine a tool trajectory with respect to a region of interest. The processor compares the trajectory to one or more measured distances between implants stored in memory to identify a requested distance measurement. The system also includes a display configured to display an image including the implants and the requested distance measurement to a user.
Public/Granted literature
- US20080114267A1 SYSTEMS AND METHODS FOR IMPLANT DISTANCE MEASUREMENT Public/Granted day:2008-05-15
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