Invention Grant
- Patent Title: Measuring system
- Patent Title (中): 测量系统
-
Application No.: US14151391Application Date: 2014-01-09
-
Publication No.: US09322637B2Publication Date: 2016-04-26
- Inventor: Yan Bondar
- Applicant: Micronas GmbH
- Applicant Address: DE Freiburg
- Assignee: Micronas GmbH
- Current Assignee: Micronas GmbH
- Current Assignee Address: DE Freiburg
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: DE102013000166 20130109
- Main IPC: G01B7/30
- IPC: G01B7/30 ; G01D5/14 ; G01P3/487

Abstract:
A measuring system is provided that includes a magnetic field sensor array, an evaluation circuit for evaluating measurement signals of the magnetic field sensor array, and a rotatable encoder that has a mass element to change a magnetic field vector in the magnetic field sensor array. The encoder has a spring element in which the mass element is attached to the spring element. The encoder has a linear guide, and the mass element is guided in a radial direction in the linear guide such that during a rotation of the encoder the mass element can be moved by centrifugal force and the centrifugal force works against the spring force of the spring element. The magnetic field sensor array is arranged toward the encoder to measure a change, caused by the movement of the mass element, in the magnetic field vector.
Public/Granted literature
- US20140191749A1 MEASURING SYSTEM Public/Granted day:2014-07-10
Information query