Invention Grant
US09322813B2 Methods and apparatus for analyzing samples and collecting sample fractions
有权
用于分析样品和收集样品级分的方法和设备
- Patent Title: Methods and apparatus for analyzing samples and collecting sample fractions
- Patent Title (中): 用于分析样品和收集样品级分的方法和设备
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Application No.: US13681069Application Date: 2012-11-19
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Publication No.: US09322813B2Publication Date: 2016-04-26
- Inventor: James Anderson, Jr. , Raaidah Saari-Nordhaus , Washington Mendoza , Josef Bystron , Romulus Gaita
- Applicant: Alltech Associates, Inc.
- Applicant Address: US MD Columbia
- Assignee: Alltech Associates, Inc.
- Current Assignee: Alltech Associates, Inc.
- Current Assignee Address: US MD Columbia
- Agent Beverly J. Artale
- Main IPC: G01N21/00
- IPC: G01N21/00 ; C22C38/00 ; G01N30/02 ; G01N1/00 ; G01N30/00 ; G01N33/00 ; G01N35/00 ; B01D15/08 ; G01N30/80 ; G01N30/46 ; G01N30/88 ; G01N30/86 ; G01N30/74 ; G01N30/82 ; G01N30/72
Abstract:
Methods and apparatus for analyzing a sample using at least one detector are disclosed.
Public/Granted literature
- US20130074579A1 Methods and Apparatus for Analyzing Samples and Collecting Sample Fractions Public/Granted day:2013-03-28
Information query
