Invention Grant
- Patent Title: Method and apparatus pertaining to testing material quality
- Patent Title (中): 测试材料质量的方法和设备
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Application No.: US14225979Application Date: 2014-03-26
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Publication No.: US09322819B2Publication Date: 2016-04-26
- Inventor: Michael Turturro , Andrew Nachenberg
- Applicant: Medline Industries, Inc.
- Applicant Address: US IL Mundelein
- Assignee: Medline Industries, Inc.
- Current Assignee: Medline Industries, Inc.
- Current Assignee Address: US IL Mundelein
- Agency: Fitch, Even, Tabin & Flannery LLP
- Main IPC: G01N3/08
- IPC: G01N3/08 ; G01N33/34 ; G01N3/42

Abstract:
A quality-control device comprises a housing, a biasing member disposed within the housing, and a reciprocating puncturing member that is configured and oriented to selectively move inwardly of the housing in opposition to the biasing member. A maximum-compression indicator is configured to move inwardly of the housing in tandem with the puncturing member and a gauge serves to correlate a particular location of the maximum-compression indicator to a corresponding measure of compression as corresponds to a material being tested for quality. By one approach the indicator moves in response to inward movement of the puncturing member but is also configured to not move when the puncturing member moves outwardly of the housing. So configured the maximum-compression indicator will remain located at a point that corresponds to the furthest inward incursion of the puncturing member in opposition to the biasing member when the user presses the puncturing member against the material.
Public/Granted literature
- US20150276569A1 Method and Apparatus Pertaining to Testing Material Quality Public/Granted day:2015-10-01
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