Invention Grant
- Patent Title: Imaging measurement system with a printed photodetector array
- Patent Title (中): 具有印刷光电检测器阵列的成像测量系统
-
Application No.: US13390529Application Date: 2010-08-05
-
Publication No.: US09322939B2Publication Date: 2016-04-26
- Inventor: Simha Levene , Ami Altman , Naor Wainer , Cornelis Reinder Ronda , Eliav Itshak Haskal , Dagobert Michel De Leeuw
- Applicant: Simha Levene , Ami Altman , Naor Wainer , Cornelis Reinder Ronda , Eliav Itshak Haskal , Dagobert Michel De Leeuw
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- International Application: PCT/IB2010/053557 WO 20100805
- International Announcement: WO2011/030240 WO 20110317
- Main IPC: G01T1/24
- IPC: G01T1/24 ; G01T1/29 ; G01T1/20

Abstract:
Low cost large area photodetector arrays are provided. In a first embodiment, the photodetectors comprise an inorganic photoelectric conversion material formed in a single thick layer of material. In a second embodiment, the photodetectors comprise a lamination of several thin layers of an inorganic photoelectric conversion material, the combined thickness of which is large enough to absorb incoming x-rays with a high detector quantum efficiency. In a third embodiment, the photodetectors comprise a lamination of several layers of inorganic or organic photoelectric conversion material, wherein each layer has a composite scintillator coating.
Public/Granted literature
- US20120153163A1 IMAGING MEASUREMENT SYSTEM WITH A PRINTED PHOTODETECTOR ARRAY Public/Granted day:2012-06-21
Information query