Invention Grant
- Patent Title: Matching object geometry with array microscope geometry
- Patent Title (中): 匹配对象几何与阵列显微镜几何
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Application No.: US14031340Application Date: 2013-09-19
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Publication No.: US09323038B2Publication Date: 2016-04-26
- Inventor: Pixuan Zhou , Chen Liang
- Applicant: DMetrix, Inc.
- Applicant Address: US AZ Tucson
- Assignee: DMetrix, Inc.
- Current Assignee: DMetrix, Inc.
- Current Assignee Address: US AZ Tucson
- Agency: Quarles & Brady, LLP
- Agent Yakov Sidorin
- Main IPC: G02B21/26
- IPC: G02B21/26 ; G02B21/00 ; G02B21/36

Abstract:
A method for object preparation for imaging with an array microscope system without scanning. Artifact-free image is formed based on scanning-free imaging of an object array formed from spatially-separated portions of the initially spatially-continuous object that are arranged, in the object plane of the array microscope, in a pattern associated with an array of individual objectives of the array microscope. The size of an individual portion of the object does not exceed the size of a FOV of the individual objective defined in the object plane.
Public/Granted literature
- US20140118527A1 MATCHING OBJECT GEOMETRY WITH ARRAY MICROSCOPE GEOMETRY Public/Granted day:2014-05-01
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