Invention Grant
- Patent Title: Noise detection for a capacitance sensing panel
- Patent Title (中): 电容检测面板的噪声检测
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Application No.: US13309674Application Date: 2011-12-02
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Publication No.: US09323385B2Publication Date: 2016-04-26
- Inventor: Hans Van Antwerpen , Scott Swindle , Aaron Hogan , Paul Kelleher
- Applicant: Hans Van Antwerpen , Scott Swindle , Aaron Hogan , Paul Kelleher
- Applicant Address: US CA Santa Clara
- Assignee: Parade Technologies, Ltd.
- Current Assignee: Parade Technologies, Ltd.
- Current Assignee Address: US CA Santa Clara
- Agency: Morgan, Lewis & Bockius LLP
- Main IPC: G06F3/00
- IPC: G06F3/00 ; G06F3/041 ; G01R27/26
Abstract:
An embodiment of a method for detecting noise for a capacitance sensing panel may comprise generating an input signal based on a noise signal, performing a series of measurements for measuring capacitances from a capacitive sensor sensitive to the noise signal, and controlling timing for at least one of the subconversions based on the input signal.
Public/Granted literature
- US20120256638A1 NOISE DETECTION FOR A CAPACITANCE SENSING PANEL Public/Granted day:2012-10-11
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