Invention Grant
- Patent Title: Microcontroller, control device and determination method
- Patent Title (中): 微控制器,控制装置及测定方法
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Application No.: US13555123Application Date: 2012-07-21
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Publication No.: US09323595B2Publication Date: 2016-04-26
- Inventor: Hiromichi Yamada , Teruaki Sakata , Nobuyasu Kanekawa , Yuichi Ishiguro , Takashi Yasumasu , Kazuyoshi Fukuda , Kesami Hagiwara
- Applicant: Hiromichi Yamada , Teruaki Sakata , Nobuyasu Kanekawa , Yuichi Ishiguro , Takashi Yasumasu , Kazuyoshi Fukuda , Kesami Hagiwara
- Applicant Address: JP Tokyo
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Tokyo
- Agency: Shapiro, Gabor and Rosenberger, PLLC
- Priority: JP2011-159805 20110721
- Main IPC: G05B19/29
- IPC: G05B19/29 ; G06F11/07

Abstract:
A microcontroller includes a central processing unit, a PWM signal generation unit which generates a PWM signal according to a generation condition of a PWM signal set by the central processing unit, and a diagnostic unit which inputs the generated PWM signal therein and detects a pulse period and a pulse width, based on the input signal and which determines whether the detected pulse period and pulse width respectively coincide with a pulse period and a pulse width corresponding to the generation condition.
Public/Granted literature
- US20130020978A1 MICROCONTROLLER, CONTROL DEVICE AND DETERMINATION METHOD Public/Granted day:2013-01-24
Information query
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