Invention Grant
- Patent Title: Automatic testing apparatus for embedded software and automatic testing method thereof
- Patent Title (中): 嵌入式软件自动测试装置及其自动测试方法
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Application No.: US14026042Application Date: 2013-09-13
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Publication No.: US09323648B2Publication Date: 2016-04-26
- Inventor: Byeong-hu Lee , Tai-ryong Kang , Sang-deok Kim , Yong-hee Park , Sang-rae Lee , Jae-hoon Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-Si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si
- Agency: Staas & Halsey LLP
- Priority: KR10-2012-0119604 20121026
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/36 ; H04N17/00 ; H04N21/442 ; H04N21/4363 ; H04N21/443

Abstract:
An automatic test apparatus for embedded software and an automatic testing method thereof, the automatic testing apparatus for embedded software, includes an output detector which collects interface status information in accordance with data transmission/reception from at least one of first and second electronic devices respectively loaded with first and second embedded software and exchanging data therebetween, and extracts a keyword from the collected interface status information, a scenario composer which uses identification information about the first and second embedded software and the extracted keyword, and composes a scenario corresponding to a predetermined event status and a control command generator which generates a control command to reproduce the event status based on the composed scenario. Thus, it is possible to previously detect unpredictable and predictable problems that may occur in interaction between the plurality of embedded software, interface operation to transmit and receive data, etc., and reproduce them.
Public/Granted literature
- US20140123111A1 AUTOMATIC TESTING APPARATUS FOR EMBEDDED SOFTWARE AND AUTOMATIC TESTING METHOD THEREOF Public/Granted day:2014-05-01
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