Invention Grant
- Patent Title: Analysis system, analysis device, and management device
- Patent Title (中): 分析系统,分析装置和管理装置
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Application No.: US14496776Application Date: 2014-09-25
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Publication No.: US09323900B2Publication Date: 2016-04-26
- Inventor: Shiro Kuwaoka , Taisuke Nishida , Shunsuke Yao
- Applicant: Sysmex Corporation
- Applicant Address: JP Kobe-shi, Hyogo
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-shi, Hyogo
- Agency: Brinks Gilson & Lione
- Priority: JP2012-077486 20120329
- Main IPC: G01N33/50
- IPC: G01N33/50 ; G06F19/00 ; G01N35/00 ; G01N31/22

Abstract:
An analysis system comprising: an analysis device that analyzes a sample using a reagent and that performs the analysis of the sample in accordance with a measurement parameter measured in relation to a reagent to be used; and a management device communicably connected to the analysis device via a network; wherein the analysis device includes a first control unit that enables execution of processing for accepting a registration of the measurement parameter, and when the measurement parameter is registered, executes processing for transmitting to the management device transmission information including information indicating that the measurement parameter is registered; and the management device includes a second control unit that executes a receiving process of receiving the transmission information transmitted from the analysis device and an output process of outputting information indicating that the measurement parameter is registered in the analysis device based on the received transmission information is disclosed.
Public/Granted literature
- US20150012227A1 ANALYSIS SYSTEM, ANALYSIS DEVICE, AND MANAGEMENT DEVICE Public/Granted day:2015-01-08
Information query
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