Invention Grant
- Patent Title: Dual event command
- Patent Title (中): 双重事件命令
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Application No.: US12478270Application Date: 2009-06-04
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Publication No.: US09324391B2Publication Date: 2016-04-26
- Inventor: Joo S. Choi , Troy A. Manning , Brent Keeth
- Applicant: Joo S. Choi , Troy A. Manning , Brent Keeth
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G06F12/02
- IPC: G06F12/02 ; G11C7/10 ; G06F13/16

Abstract:
A technique to increase transfer rate of command and address signals via a given number of command and address pins in each of one or more integrated circuit memory devices during a clock cycle of a clock signal. In one example embodiment, the command and address signals are sent on both rising and falling edges of a clock cycle of a clock signal to increase the transfer rate and essentially reduce the number of required command and address pins in each integrated circuit memory device.
Public/Granted literature
- US20090248970A1 DUAL EDGE COMMAND Public/Granted day:2009-10-01
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