Invention Grant
- Patent Title: MRAM sensing with magnetically annealed reference cell
- Patent Title (中): 具有磁退火参考电池的MRAM感测
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Application No.: US14156541Application Date: 2014-01-16
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Publication No.: US09324404B2Publication Date: 2016-04-26
- Inventor: Hari M. Rao , Xiaochun Zhu
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Elaine Lo
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/16 ; H01L43/12 ; G11C7/14 ; G11C13/00

Abstract:
Systems and method for reading/sensing data stored in magnetoresistive random access memory (MRAM) cells using magnetically annealed reference cells. A MRAM includes a reference circuit comprising at least one magnetic storage cell, wherein each magnetic storage cell in the MRAM is programmed to the same state. The reference circuit includes a load element coupled to the magnetic storage cell, wherein the load element is configured to establish a reference voltage during a read operation.
Public/Granted literature
- US20140126284A1 MRAM SENSING WITH MAGNETICALLY ANNEALED REFERENCE CELL Public/Granted day:2014-05-08
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